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Volumn 13, Issue 5, 2013, Pages 1928-1933

Rational defect introduction in silicon nanowires

Author keywords

defects; nanowire; Silicon; stacking fault; twin

Indexed keywords

DEFECT GENERATION; PLANAR DEFECT; SEMICONDUCTOR NANOWIRE; SI NANOWIRE; SILICON NANOWIRES; STRUCTURAL FEATURE; TWIN; TWIN BOUNDARIES;

EID: 84877300517     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl3042728     Document Type: Article
Times cited : (42)

References (35)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.