Hidden defects in silicon nanowires

Nanotechnology

Volumn 23, Issue 2, 2012, Pages

  Den Hertog, M I ^a   Cayron, C ^b   Gentile, P ^a   Dhalluin, F ^a,c   Oehler, F ^a   Baron, T ^c   Rouviere, J L ^a  

^a UNIV GRENOBLE ALPES   (France)

^b CEA GRENOBLE   (France)

^c Laboratoire Interdisciplinaire de Physique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AL-DOPING; CONVENTIONAL TEM; CRYSTAL GRAINS; CUBIC STRUCTURE; DARK FIELD IMAGES; GROWTH AXIS; HEXAGONAL PHASE; HEXAGONAL PHASIS; HRTEM IMAGES; LONG RANGE ORDERS; PLANAR DEFECT; RAMAN EXPERIMENTS; RAMAN PEAK; SI NANOWIRE; SILICON CRYSTAL; SILICON NANOWIRES;

CRYSTAL STRUCTURE; DIFFRACTION PATTERNS; INTERFEROMETRY; NANOWIRES; SILICON;

DEFECTS;

EID: 83755161619     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/2/025701     Document Type: Article

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