Crystal structure transfer in core/shell nanowires

Nano Letters

Volumn 11, Issue 4, 2011, Pages 1690-1694

  Algra, Rienk E ^a,b,c   Hocevar, Moïra ^b,d   Verheijen, Marcel A ^b,e   Zardo, Ilaria ^f   Immink, George G W ^b   Van Enckevort, Willem J P ^c   Abstreiter, Gerhard ^f   Kouwenhoven, Leo P ^d   Vlieg, Elias ^c   Bakkers, Erik P A M ^d,e  

^a MATERIALS INNOVATION INSTITUTE M2I   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

^c RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^d DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^e EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^f WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

epitaxy; Nanowire; silicon; structure transfer; superlattice; wurtzite

Indexed keywords

CORE WIRES; CORE/SHELL; EPITAXIALLY GROWN; EPITAXY; OPTOELECTRONIC PROPERTIES; SEMICONDUCTOR INDUSTRY; SHELL THICKNESS; SI NANOWIRE; STRUCTURE ENGINEERING; STRUCTURE TRANSFER; WET-CHEMICAL ETCH; WURTZITE CRYSTAL STRUCTURE; WURTZITES; ZINC BLENDE CRYSTAL STRUCTURE;

ELECTRONIC PROPERTIES; EPITAXIAL GROWTH; GALLIUM PHOSPHIDE; LATTICE CONSTANTS; NANOTUBES; NANOWIRES; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SUPERLATTICES; TWINNING; WIRE; ZINC SULFIDE;

CRYSTAL STRUCTURE;

NANOMATERIAL; SILICON;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; SILICON; SURFACE PROPERTIES;

EID: 79954467868     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl200208q     Document Type: Article

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