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Journal of Alloys and Compounds

Volumn 575, Issue , 2013, Pages 90-95

Effect of bivalent Co ion doping on electric properties of Bi 0.85Nd0.15FeO3 thin film

(2) Xue, Xu a Tan, Guoqiang a

a SHAANXI UNIVERSITY OF SCIENCE AND TECHNOLOGY (China)

Author keywords

Conduction mechanism; Ferroelectric property; XPS analysis

Indexed keywords

CERAMIC MATRIX COMPOSITES; COBALT; DEFECTS; ELECTRIC FIELDS; FERROELECTRIC FILMS; FERROELECTRICITY; INTERFACES (MATERIALS); IONS; IRON OXIDES; LEAKAGE CURRENTS; OXYGEN VACANCIES; SEMICONDUCTOR DOPING; X RAY PHOTOELECTRON SPECTROSCOPY;

BREAKDOWN CHARACTERISTICS; CONDUCTION MECHANISM; FERROELECTRIC BEHAVIOR; FERROELECTRIC PROPERTY; FREQUENCY DEPENDENCE; HIGH ELECTRIC FIELDS; THREE ORDERS OF MAGNITUDE; XPS ANALYSIS;

THIN FILMS;

EID: 84877089294 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2013.04.080 Document Type: Article

Times cited : (18)

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