Strain mapping of LED devices by dark-field inline electron holography: Comparison between deterministic and iterative phase retrieval approaches

Ultramicroscopy

Volumn 127, Issue , 2013, Pages 119-125

  Song, Kyung ^a   Shin, Ga Young ^a   Kim, Jong Kyu ^a   Oh, Sang Ho ^a   Koch, Christoph T ^b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

Dark field inline holography; Lattice strain; Light emitting diode; Multi quantum well; Transport of intensity equation

Indexed keywords

ADJUSTABLE PARAMETERS; IN-LINE ELECTRON HOLOGRAPHY; IN-LINE HOLOGRAPHY; ITERATIVE APPROACH; ITERATIVE RECONSTRUCTION ALGORITHMS; LATTICE STRAIN; MULTIQUANTUM WELLS; TRANSPORT OF INTENSITY EQUATIONS;

ELECTRON HOLOGRAPHY; ITERATIVE METHODS; PHASE MEASUREMENT; PHASE SHIFTERS; TRANSMISSION ELECTRON MICROSCOPY;

LIGHT EMITTING DIODES;

ARTICLE; CONTROLLED STUDY; CRYSTAL STRUCTURE; DARK FIELD INLINE ELECTRON HOLOGRAPHY; DARK FIELD MICROSCOPE; GEOMETRY; HOLOGRAPHY; IMAGE INTENSIFIER; IMAGE PROCESSING; IMAGE RECONSTRUCTION; IMAGE RETRIEVAL; INTERMETHOD COMPARISON; LIGHT EMITTING DIODE; LOW FREQUENCY NOISE; MULTIPLE QUANTUM WELL; PROCESS OPTIMIZATION; STRAIN IDENTIFICATION; TASK PERFORMANCE; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT OF INTENSITY EQUATION;

EID: 84875507238     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.07.010     Document Type: Article

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