Phase measurement of atomic resolution image using transport of intensity equation

Journal of Electron Microscopy

Volumn 54, Issue 3, 2005, Pages 191-197

  Ishizuka, Kazuo ^a   Allman, Brendan ^b  

^a Higashimatsuyama   (Japan)

^b IATIA Ltd   (Australia)

Author keywords

Aberration correction; HREM; Phase measurement; Quantitative phase imaging; Transfer of intensity equation

Indexed keywords

ABERRATIONS; ELECTRONS; HIGH RESOLUTION ELECTRON MICROSCOPY; WAVE PROPAGATION;

ABERRATION CORRECTION; ATOMIC RESOLUTION IMAGES; HIGH-ENERGY ELECTRON; INTENSITY EQUATION; LOWER FREQUENCY COMPONENTS; MEASUREMENTS OF; PHASE INFORMATION; QUANTITATIVE PHASE IMAGING; TRANSFER OF INTENSITY EQUATION; TRANSPORT OF INTENSITY;

PHASE MEASUREMENT;

EID: 27744494251     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfi024     Document Type: Article

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