SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Journal of Materials Science and Technology

Volumn 18, Issue 2, 2002, Pages 135-138

Lattice distortion analysis directly from high resolution transmission electron microscopy images-the LADIA program package

(4) Du, K a Rau, Y a Jin Phillipp, N Y a Phillipp, F a

a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

Author keywords

Distortion analysis; High resolution transmission electron microscopy

Indexed keywords

CRYSTAL STRUCTURE; DEFORMATION; IMAGE ANALYSIS; OPTICAL RESOLVING POWER; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TEM; LATTICE DISTORTION ANALYSIS;

CRYSTAL LATTICES;

EID: 0036520949 PISSN: 10050302 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (63)

References (28)

1
- 0000546080
- (1997) Rep. Prog. Phys. , vol.60 , pp. 1513
- Smith, D.J.¹

2
- 0032157212
- (1998) Mater. Trans. JIM , vol.39 , pp. 888
- Phillipp, F.¹

3
- 0033365821
- (1999) Mater. Sci. Eng. , vol.R26 , pp. 1
- Spence, J.C.H.¹

4
- 0031918214
- (1998) J. Microsc. , vol.190 , pp. 109
- Möbus, G.¹ Schweinfest, R.² Gemming, T.³ Wagner, T.⁴ Rühle, M.⁵

5
- 0030272105
- (1996) Ultramicroscopy , vol.65 , pp. 217
- Möbus, G.¹ Dehm, G.²

6
- 85151263989
- (1998) J. Microsc. , vol.190 , pp. 131
- King, W.E.¹ Camplbell, G.H.² Follies, S.M.³ Cohen, D.⁴ Hanson, K.M.⁵

7
- 0032965643
- (1999) J. Microsc. , vol.194 , pp. 142
- Schweinfest, R.¹ Ernst, F.² Wagner, T.³ Ruhle, M.⁴

8
- 0001606692
- (1995) Appl. Phys. Lett. , vol.67 , pp. 1763
- Hillebrand, R.¹ Hofmeister, H.² Werner, P.³ Gosele, U.⁴

9
- 0031921528
- (1998) J. Microsc. , vol.190 , pp. 171
- Schwander, P.¹ Rau, W.-D.² Ourmazd, A.³

10
- 0027639651
- (1993) Ultramicroscopy , vol.50 , pp. 321
- Stenkamp, D.¹ Jager, W.²

11
- 77957695467
- (1999) Advances in Imaging and Electron Physics , vol.107 , pp. 121
- Rosenauer, A.¹ Gerthsen, D.²

12
- 0027543392
- (1993) Ultramicroscopy , vol.49 , pp. 273
- Bierwolf, R.¹ Hohenstein, M.² Philipp, F.³ Brandt, O.⁴ Crook, G.E.⁵ Ploog, K.⁶

13
- 0028533603
- (1994) Ultramicroscopy , vol.56 , pp. 94
- Bayle, P.¹ Deutsch, T.² Gilles, B.³ Lancon, F.⁴ Marty, A.⁵ Thibault, J.⁶

14
- 0001748945
- (1994) J. Appl. Phys. , vol.75 , pp. 7310
- Jouneau, P.H.¹ Tardot, A.² Feuillet, G.³ Mariette, G.⁴ Cibert, J.⁵

15
- 0029352483
- (1995) Phys. Stat. Sol. (a) , vol.150 , pp. 625
- Seitz, H.¹ Seibt, M.² Baumann, F.H.³ Ahlborn, K.⁴ Schroter, W.⁵

16
- 0010478403
- PV-WAVE Version 7.00
- Visual Numerics Inc. Houston, Texas, USA

17
- 0033004878
- (1999) J. Microsc. , vol.194 , pp. 161
- Jin-Phillipp, N.Y.¹ Phillipp, F.²

18
- 0002287536
- (2000) J. Appl. Phys. , vol.88 , pp. 710
- Jin-Philllipp, N.Y.¹ Phillipp, F.²

19
- 0010480807
- Microscopy of semiconducting materials
- In Press
- (2001) Inst. Phys. Conf. Ser.
- Jin-Philipp, N.Y.¹ Zundel, M.K.² Du, K.³ Phillipp, F.⁴ Eberl, K.⁵

20
- 0039523734
- (1999) Phil. Mag. A , vol.79 , pp. 1009
- Sigle, W.¹

21
- 0003693963
- Oxford University Press, Oxford
- (1986) Experimental High-Resolution Electron Microscopy
- Spence, J.C.H.¹

22
- 0010442154
- Brno
- (2000) Proc. 12th Europ. Congr. on Electron Microscopy , pp. 1137
- Du, K.¹ Jin-Phillipp, N.Y.² Phillipp, F.³

23
- 0023162961
- (1986) Ultramicroscopy , vol.21 , pp. 131
- Stadelmann, P.A.¹

24
- 0031896717
- (1998) J. Microsc. , vol.190 , pp. 184
- Seitz, H.¹ Ahlborn, K.² Seibt, M.³ Schroter, W.⁴

25
- 0003409574
- Prentice Hall, Upper Saddle River
- (1996) Digital Image Processing , pp. 224
- Castleman, K.R.¹

26
- 0002915686
- Hawkes P.W. (ed.), Springer, Berlin
- (1980) Computer Processing of Electron Microscopy Images , pp. 187
- Frank, J.¹

27
- 0004161838
- Cambridge University Press, Cambridge
- (1992) Numerical Recipes in Fortran
- Press, W.H.¹ Tenolsky, S.A.² Vetterling, W.T.³ Flannery, B.P.⁴

28
- 0010480808
- In Press
- J. Appl. Phys.
- Jin-Phillipp, N.Y.¹ Du, K.² Phillipp, F.³ Zundel, M.⁴ Eberl, K.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.