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Volumn 214, Issue 1, 2004, Pages 51-61

Quantitative phase-amplitude microscopy. III. The effects of noise

Author keywords

Inline holography; Microscopy; Phase contrast; Phase retrieval

Indexed keywords

EFFECT OF NOISE; IN-LINE HOLOGRAPHY; MICROSCOPY TECHNIQUE; NOISY DATA; PHASE RETRIEVAL; PHASE-CONTRAST;

EID: 1842558857     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01295.x     Document Type: Article
Times cited : (208)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.