Control of radiation damage in the TEM

Ultramicroscopy

Volumn 127, Issue , 2013, Pages 100-108

  Egerton, R F ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BRIGHTFIELD; DARK FIELD MICROSCOPY; IMAGING MODES; LOW DOSE; OPERATIONAL MODES; PHASE-CONTRAST; SOFT MATERIAL; TRANSMISSION ELECTRON MICROSCOPE;

RADIATION CHEMISTRY; TRANSMISSION ELECTRON MICROSCOPY;

RADIATION DAMAGE;

ARTICLE; BRIGHT FIELD MICROSCOPY; CONTROLLED STUDY; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; IONIZATION; OSCILLATION; RADIATION INJURY; RADIATION SCATTERING; RADIOLYSIS; RADIOSENSITIVITY; SIGNAL NOISE RATIO; STATIC ELECTRICITY; THERMAL CONDUCTIVITY; TRANSMISSION ELECTRON MICROSCOPY;

ANIMALS; ARTIFACTS; ELECTROMAGNETIC RADIATION; HUMANS; MICROSCOPY, ELECTRON, TRANSMISSION;

EID: 84875501008     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.07.006     Document Type: Article

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