Low voltage STEM imaging of multi-walled carbon nanotubes

Micron

Volumn 43, Issue 2-3, 2012, Pages 428-434

  Beyer, Y ^a   Beanland, R ^a   Midgley, P A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Carbon nanotubes; FEGSEM; Low voltage microscopy; Monte Carlo simulations; STEM

Indexed keywords

BRIGHTFIELD; DARK-FIELD; DUAL-BEAM MICROSCOPES; FEG-SEM; HIGH CONTRAST; IMAGE CONTRASTS; INTERNAL STRUCTURE; LOW VOLTAGES; MONTE CARLO; MONTE CARLO SIMULATION; MULTI-SEGMENT; STEM; STEM IMAGES;

CARBON; CARBON NANOTUBES; ELECTRON BEAMS;

MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 84855247293     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2011.10.016     Document Type: Article

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