Advances in the transmission electron microscopy of polymers

Polymer Reviews

Volumn 50, Issue 3, 2010, Pages 321-339

  Libera, Matthew R ^a   Egerton, Ray F ^b  

^a Stevens Institute of Technology   (United States)

^b UNIVERSITY OF ALBERTA   (Canada)

Author keywords

electron microscopy; holography; image contrast; image resolution; phase contrast; polymer; radiation damage; stain; TEM

Indexed keywords

ANALYTICAL MICROSCOPY; CONTROL PROPERTIES; ELASTIC INTERACTIONS; ENERGETIC ELECTRON; FIELD IMAGING; HIGH-RESOLUTION IMAGING; IMAGE CONTRASTS; INORGANIC SYSTEMS; LIGHT ELEMENTS; MATERIAL INTERACTIONS; MATERIALS SCIENCE AND ENGINEERING; PHASE CONTRASTS; POLYMER INTERACTIONS; PROBLEM DEFINITION; RADIATION-SENSITIVE MATERIALS; SPATIAL RESOLUTION; STAIN; STRUCTURE PROPERTY; SYNTHETIC MATERIALS; SYNTHETIC POLYMERS; TEM; WELL-ESTABLISHED TECHNIQUES;

BIOLOGICAL MATERIALS; CHEMICAL ELEMENTS; ELECTRONS; HOLOGRAPHY; IMAGE RESOLUTION; MATERIALS SCIENCE; RADIATION DAMAGE; TRANSMISSION ELECTRON MICROSCOPY;

POLYMERS;

EID: 77955898245     PISSN: 15583724     EISSN: 15583716     Source Type: Journal    
DOI: 10.1080/15583724.2010.493256     Document Type: Article

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