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Volumn 101, Issue 2-4, 2004, Pages 161-172

Radiation damage in coronene, rubrene and p-terphenyl, measured for incident electrons of kinetic energy between 100 and 200 kev

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; CRYSTALLIZATION; DEGRADATION; ELECTRIC EXCITATION; ELECTRIC POTENTIAL; ELECTRON IRRADIATION; ELECTRON MICROSCOPY; KINETIC ENERGY; MOLECULAR STRUCTURE; RADIATION DAMAGE; SCANNING ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS;

EID: 4644278638     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.05.010     Document Type: Article
Times cited : (33)

References (29)
  • 14
    • 0003521686 scopus 로고    scopus 로고
    • Transmission Electron Microscopy
    • Heidelberg: Springer. p.469
    • Reimer L. Transmission Electron Microscopy. 4th Edition:1997;Springer, Heidelberg. p.469
    • (1997) 4th Edition
    • Reimer, L.1
  • 22
    • 0003521686 scopus 로고    scopus 로고
    • Scanning Electron Microscopy
    • Berlin: Springer. ,p.144
    • Reimer L. Scanning Electron Microscopy. 2nd Edition:1985;Springer, Berlin.,p.144
    • (1985) 2nd Edition
    • Reimer, L.1
  • 28
    • 0011621219 scopus 로고
    • J.N. Chapman, & A.J. Craven. Edinburgh: SUSSP Publications. (Chapter 11)
    • Hobbs L. Chapman J.N., Craven A.J. Quantitative Electron Microscopy. 1984;SUSSP Publications, Edinburgh. (Chapter 11)
    • (1984) Quantitative Electron Microscopy
    • Hobbs, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.