Fabrication and properties of ZnO/GaN heterostructure nanocolumnar thin film on Si (111) substrate

Nanoscale Research Letters

Volumn 8, Issue 1, 2013, Pages 1-7

  Wei, Xianqi ^a   Zhao, Ranran ^a   Shao, Minghui ^a   Xu, Xijin ^a   Huang, Jinzhao ^a  

^a UNIVERSITY OF JINAN   (China)

Author keywords

Crystal structure; GaN buffer layer; Optical properties; PLD; ZnO thin films

Indexed keywords

BUFFER LAYERS; CHROMIUM COMPOUNDS; CRYSTAL STRUCTURE; FIELD EMISSION MICROSCOPES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GALLIUM NITRIDE; II-VI SEMICONDUCTORS; III-V SEMICONDUCTORS; LIGHT ABSORPTION; METALLIC FILMS; MORPHOLOGY; OPTICAL FILMS; OPTICAL PROPERTIES; OXIDE FILMS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SILICON; SUBSTRATES; SURFACE MORPHOLOGY; ZINC OXIDE;

FIELD EMISSION SCANNING ELECTRON MICROSCOPY; GAN BUFFER LAYERS; PHOTOLUMINISCENCE SPECTRUM; SCANNING ELECTRON MICROSCOPY IMAGE; ULTRAVIOLET EMISSION; ZINC OXIDE THIN FILMS; ZNO THIN FILM; ZNO/GAN HETEROSTRUCTURE;

THIN FILMS;

EID: 84875177351     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-8-112     Document Type: Article

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