Quantitative x-ray phase imaging at the nanoscale by multilayer Laue lenses

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Yan, Hanfei ^a   Chu, Yong S ^a   Maser, Jörg ^b,c   Nazaretski, Evgeny ^a   Kim, Jungdae ^a,f   Kang, Hyon Chol ^d   Lombardo, Jeffrey J ^e   Chiu, Wilson K S ^e  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c Center for Nanoscale Materials   (United States)

^d Chosun University   (South Korea)

^e UNIVERSITY OF CONNECTICUT   (United States)

^f University of Ulsan   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHM; ARTICLE; DIAGNOSTIC IMAGING; MICROSCOPY; THEORETICAL MODEL; X RAY DIFFRACTION;

ALGORITHMS; DIAGNOSTIC IMAGING; MICROSCOPY; MODELS, THEORETICAL; X-RAY DIFFRACTION;

MLCS; MLOWN;

EID: 84874289358     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep01307     Document Type: Article

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