Scanning transmission X-ray microscopy with a fast framing pixel detector

Ultramicroscopy

Volumn 110, Issue 9, 2010, Pages 1143-1147

  Menzel, A ^a   Kewish, C M ^b   Kraft, P ^a   Henrich, B ^a   Jefimovs, K ^c   Vila Comamala, J ^a   David, C ^a   Dierolf, M ^d,e   Thibault, P ^d   Pfeiffer, F ^d   Bunk, O ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b SYNCHROTRON SOLEIL   (France)

^c SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^d TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^e EPFL   (Switzerland)

Author keywords

Phase contrast; Scanning transmission X ray microscopy; X ray microscopy

Indexed keywords

AREA DETECTORS; DARK FIELD IMAGING; DETECTION SCHEME; HARD X RAY; IMAGING MODES; PHASE CONTRASTS; PILATUS; PIXEL DETECTOR; SCANNING TRANSMISSION X RAY MICROSCOPY; SINGLE-PHOTON COUNTING; TRANSMISSION FUNCTION; X RAY MICROSCOPY;

DETECTORS; IMAGING TECHNIQUES; SCANNING; X RAY MICROSCOPES;

X RAYS;

ARTICLE; CONTROLLED STUDY; DARK FIELD IMAGING; DIFFRACTION; ILLUMINATION; IMAGE PROCESSING; IMAGE QUALITY; IMAGING; PHASE CONTRAST IMAGING; RADIATION SCATTERING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCANNING TRANSMISSION X RAY MICROSCOPY;

EID: 77955517634     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.04.007     Document Type: Article

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