Contrast mechanisms in scanning transmission x-ray microscopy

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 80, Issue 4, 2009, Pages

  Thibault, Pierre ^a,b   Dierolf, Martin ^a,b   Kewish, Cameron M ^a   Menzel, Andreas ^a   Bunk, Oliver ^a   Pfeiffer, Franz ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARRAY DETECTORS; CERIUM OXIDES; CONTRAST MECHANISM; DEFOCUS; DIFFERENTIAL ABSORPTION; DIFFERENTIAL CONTRAST; EXPERIMENTAL CONDITIONS; FOCUS SERIES; IMAGE SERIES; SCANNING TRANSMISSION X RAY MICROSCOPY;

ABSORPTION; CERIUM; CERIUM COMPOUNDS; INTERCONNECTION NETWORKS; X RAY MICROSCOPES;

PRINCIPAL COMPONENT ANALYSIS;

EID: 70350048767     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.80.043813     Document Type: Article

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