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Review of Scientific Instruments

Volumn 80, Issue 3, 2009, Pages

Scanning hard x-ray differential phase contrast imaging with a double wedge absorber

(5) Mukaide, Taihei a Takada, Kazuhiro a Watanabe, Masatoshi a Noma, Takashi a Iida, Atsuo b

a CANON INC (Japan)

b INSTITUTE OF MATERIALS STRUCTURE SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FLIGHT DYNAMICS; IMAGE RESOLUTION;

DETECTION LIMITS; DIFFERENTIAL PHASE CONTRASTS; DOUBLE WEDGES; FIELD OF VIEWS; FOURIER; HARD X-RAYS; IS FLEXIBILITIES; LINE INTEGRATIONS; MICRO BEAMS; PHASE GRADIENTS; PHASE MAPS; REFRACTION ANGLES; X-RAY BEAMS; X-RAY INTENSITIES;

REFRACTION;

ARTICLE; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; IMAGE QUALITY; INSTRUMENTATION; RADIOGRAPHY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; RADIOGRAPHIC IMAGE ENHANCEMENT; RADIOGRAPHY; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 63649152257 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3095440 Document Type: Article

Times cited : (10)

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