Diffracting aperture based differential phase contrast for scanning X-ray microscopy

Optics Express

Volumn 10, Issue 20, 2002, Pages 1111-1117

  Kaulich, Burkhard ^a   Polack, Francois ^b   Neuhaeusler, Ulrich ^c   Susini, Jean ^c   Di Fabrizio, Enzo ^d   Wilhein, Thomas ^e  

^a SINCROTRONE TRIESTE   (Italy)

^b SYNCHROTRON SOLEIL   (France)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d LABORATORIO TASC   (Italy)

^e University for Applied Sciences   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; INTERFEROMETRY; MONOCHROMATORS; PHOTODIODES; REFRACTIVE INDEX; SCANNING; SYNCHROTRON RADIATION; X RAY MICROSCOPES;

DIFFERENTIAL PHASE CONTRAST (DFC); INTENSITY GRADIENT; LOW ABSORBING SPECIMEN; PHOTON ENERGY;

DIFFRACTIVE OPTICS;

EID: 0037924483     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.10.001111     Document Type: Article

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