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Volumn 102, Issue 4, 2013, Pages

Damage and strain in single-layer graphene induced by very-low-energy electron-beam irradiation

Author keywords

[No Author keywords available]

Indexed keywords

DOSE-DEPENDENT; ELECTRON BEAM ENERGY; ELECTRON ENERGIES; ELECTRON-BEAM IRRADIATIONS; INTERNAL STRAINS; PEAK INTENSITY; PEAK SHIFT; SINGLE LAYER; STRAIN INDUCED; STRONG DEPENDENCES;

EID: 84873574836     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4790388     Document Type: Article
Times cited : (38)

References (41)
  • 11
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    • 10.1088/0034-4885/62/8/201
    • F. Banhart, Rep. Prog. Phys. 62, 1181 (1999). 10.1088/0034-4885/62/8/201
    • (1999) Rep. Prog. Phys. , vol.62 , pp. 1181
    • Banhart, F.1
  • 14
    • 35148854649 scopus 로고    scopus 로고
    • 10.1080/14786430701210023
    • R. H. Telling and M. I. Heggie, Philos. Mag. 87, 4797 (2007). 10.1080/14786430701210023
    • (2007) Philos. Mag. , vol.87 , pp. 4797
    • Telling, R.H.1    Heggie, M.I.2
  • 29
  • 32
    • 0027632805 scopus 로고
    • 10.1088/0957-4484/4/3/006
    • K. I. Schiffmann, Nanotechnology 4, 163 (1993). 10.1088/0957-4484/4/3/006
    • (1993) Nanotechnology , vol.4 , pp. 163
    • Schiffmann, K.I.1
  • 41
    • 0029727975 scopus 로고    scopus 로고
    • 10.1088/0031-8949/1996/T64/001
    • T. Tanabe, Phys. Scr. T64, 7 (1996). 10.1088/0031-8949/1996/T64/001
    • (1996) Phys. Scr. , vol.64 , pp. 7
    • Tanabe, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.