Reducing test execution cost of integrated, heterogeneous systems using continuous test data

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 30, Issue 1, 2011, Pages 148-158

  Biswas, Sounil ^a   Blanton, R D ^b  

^a NVIDIA   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Binary decision forest; Integrated system test; Statistical learning; Test compaction

Indexed keywords

ACCELEROMETERS; ELECTROMECHANICAL DEVICES; FORESTRY; INTEGRATED CONTROL; LEARNING ALGORITHMS; MEMS; SPACE OPTICS; SPECIFICATIONS;

BINARY DECISION; HETEROGENEOUS SYSTEMS; INTEGRATED SYSTEMS; MICROELECTROMECHANICAL SYSTEM ACCELEROMETERS; PERFORMANCE SPECIFICATIONS; RESPONSE MEASUREMENT; STATISTICAL LEARNING; TEST COMPACTION;

COST REDUCTION;

EID: 84863177684     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2010.2066630     Document Type: Article

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