Statistical test compaction using binary decision trees

IEEE Design and Test of Computers

Volumn 23, Issue 6, 2006, Pages 452-462

  Biswas, Sounil ^a   Blanton, Ronald D ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Binary decision trees; Heterogeneous devices; Kept tests; Qo no go testing; Redundant tests; Statistical test compaction

Indexed keywords

ACCELEROMETERS; MICROELECTROMECHANICAL DEVICES; OPTIMIZATION; REDUNDANCY; STATISTICAL MECHANICS; TREES (MATHEMATICS);

BINARY DECISION TREES; PREDICTION ERROR; STATISTICAL TEST COMPACTION;

DECISION THEORY;

EID: 33846116584     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2006.154     Document Type: Article

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