Non-RF to RF test correlation using learning machines: A case study

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2007, Pages 9-14

  Stratigopoulos, Haralampos G D ^a   Drineas, Petros ^b   Slamani, Mustapha ^c   Makris, Yiorgos ^d  

^a TIMA LABORATORY   (France)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^c IBM   (United States)

^d Yale University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CORRELATION METHODS; COST EFFECTIVENESS; NEURAL NETWORKS; SET THEORY;

INDUSTRIALLY ACCEPTABLE LEVELS; ONTOGENIC NEURAL NETWORKS; PRODUCTION TESTING;

LEARNING SYSTEMS;

EID: 37549004044     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2007.41     Document Type: Conference Paper

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