Quality improvement and cost reduction using statistical outlier methods

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn , Issue , 2009, Pages 64-69

  Nanar, Amit ^a   Butler, Kenneth M ^a   Carulli Jr , John M ^a   Weinberger, Charles ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BURN-IN; IC MANUFACTURING; QUALITY IMPROVEMENT; SCREENING METHODS; STATISTICAL APPROACH; TEST PROCESS; WAFER PROBES;

COST REDUCTION; INTEGRATED CIRCUITS;

DESIGN;

EID: 77950985239     PISSN: 10636404     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2009.5413175     Document Type: Conference Paper

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