The effectiveness of IDDQ and high voltage stress for burn-in elimination [CMOS production]

Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996

Volumn , Issue , 1996, Pages 9-13

  Kawahara, R ^a   Nakayama, O ^a   Kurasawa, T ^a  

^a Kawasaki Steel Inc   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; FAILURE ANALYSIS;

BURN-IN-ELIMINATION; COST-EFFECTIVE TECHNOLOGY; ELECTRICAL STRESS; FAILURE RATE; HIGH-VOLTAGE STRESS; IDDQ TESTING; PRODUCTION LINE; SCREENING DEVICES;

CMOS INTEGRATED CIRCUITS;

EID: 84895110189     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IDDQ.1996.557800     Document Type: Conference Paper

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