Important test selection for screening potential customer returns

Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011

Volumn , Issue , 2011, Pages 171-174

  Sumikawa, Nik ^a   Drmanac, Dragoljub ^a   Wang, Li C ^a   Winemberg, Leroy ^b   Abadir, Magdy S ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OUTLIER ANALYSIS; POTENTIAL CUSTOMERS; QUALITY REQUIREMENTS; TEST DATA; TEST QUALITY; TEST SELECTION; TEST STRATEGIES; WAFER PROBES;

CUSTOMER SATISFACTION; SALES;

TESTING;

EID: 79959515331     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VDAT.2011.5783603     Document Type: Conference Paper

References (7)

1. Nik Sumikawa, Dragoljub Dramanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir. Understanding Customer Returns From A Test Perspective. In VTS, 2011.
2. D. Drmanac, N. Sumikawa, L. Winemberg, L. Wang, M. Abadir. Parametric Test Set Optimization of Wafer Probe Data for Predicting in Field Failures and Setting Tighter Test Limit. In DATE, 2011.
3. Sean H. Wu, Dragoljub (Gagi) Drmanac, Li-C. Wang A Study of Outlier Analysis Techniques for Delay Testing. In ITC, 2008.
4. Bernhard Scholkopf, et al. Estimating the Support of a High- Dimensional Distribution. In Neural Computation, 2001.
5. B. Scholkopf, A. Smola, R. Williamson, and P. L. Bartlett. New support vector algorithms. Neural Computation, 2000.
6. Li-C. Wang, Pouria Bastani, Magdy S. Abadir. Design-Silicon Timing Correlation - A Data Mining Perspective. section 4.2, Figure 8, DAC, 2007, pp. 384-389. (Pubitemid 47129994)
7. George Forman. An Extensive Empirical Study of Feature Selection Metrics for Text Classification. In Journal of Machine Learning, 2003.