Schottky nanocontact on single crystalline ZnO nanorod using conductive atomic force microscopy

Journal of Nanoparticle Research

Volumn 15, Issue 1, 2013, Pages

  Panda, S K ^a   Sant, S B ^a   Jacob, C ^a   Shin, Hyunjung ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b Sungkyunkwan University   (South Korea)

Author keywords

Conducting atomic force microscopy; Nanorods; Nanoscale Schottky contact; Photoluminescence; TEM; ZnO

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINARY ALLOYS; CRYSTALLINITY; FIELD EFFECT TRANSISTORS; II-VI SEMICONDUCTORS; NANORODS; PHOTOLUMINESCENCE; SCHOTTKY BARRIER DIODES; THERMAL EVAPORATION; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE; ZINC SULFIDE;

CONDUCTING ATOMIC FORCE MICROSCOPY; CONDUCTIVE ATOMIC FORCE MICROSCOPY; DEVICE PERFORMANCE; EFFECTIVE CONTACT; ROOM-TEMPERATURE PHOTOLUMINESCENCE; SCHOTTKY BARRIER HEIGHTS; SCHOTTKY CONTACTS; SINGLE-CRYSTALLINE;

OXIDE MINERALS;

NANOROD; SILICON; ZINC OXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; EVAPORATION; PRIORITY JOURNAL; ROOM TEMPERATURE; SYNTHESIS;

EID: 84871537579     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-012-1361-z     Document Type: Article

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