Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by atomic force microscopy

Nanoscale Research Letters

Volumn 6, Issue , 2011, Pages 1-10

  Dominiczak, Maguy ^a,b   Otubo, Larissa ^a   Alamarguy, David ^b   Houzé, Frédéric ^b   Volz, Sebastian ^a   Noël, Sophie ^b   Bai, Jinbo ^a  

^a ECOLE CENTRALE PARIS   (France)

^b UNIV PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CONDUCTIVE TIPS; CONTACT FORCES; DIAMOND LAYERS; DIAMOND TIP; DIRECT POLARIZATION; ELECTRICAL RESISTANCES; ELECTRICAL SIGNAL; ELECTROCHEMICAL PHENOMENA; FINAL OBJECTIVE; INTRINSIC RESISTANCE; METAL-COATED; OXIDATION MECHANISMS; RESISTANCE MODELS; RESISTANCE NETWORK; SERIES-PARALLEL; SUBSTRATE SURFACE; THEORETICAL CALCULATIONS; TIP APEX;

AMORPHOUS CARBON; ATOMIC FORCE MICROSCOPY; CONTACT RESISTANCE; DIAMONDS; ELECTRIC NETWORK ANALYSIS; MAPPING; MAPS; SUBSTRATES;

MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 84856035409     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-6-335     Document Type: Article

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