Effect of hydrogen peroxide treatment on the characteristics of Pt Schottky contact on n-type ZnO

Applied Physics Letters

Volumn 86, Issue 11, 2005, Pages 1-3

  Kim, Sang Ho ^a   Kim, Han Ki ^b   Seong, Tae Yeon ^a  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

^b Samsung SDI   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN PEROXIDE; LEAKAGE CURRENTS; LIGHT EMITTING DIODES; PHOTOLUMINESCENCE; SCHOTTKY BARRIER DIODES; SURFACE TREATMENT; ULTRAVIOLET DETECTORS; ZINC OXIDE;

BIAS VOLTAGE; DEEP-LEVEL TRANSIENT SPECTROSCOPY (DLTS); MECHANICAL MASKS; SCHOTTKY CONTACTS;

PLATINUM;

EID: 17944372404     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1862772     Document Type: Article

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