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Volumn 68, Issue 18, 2003, Pages
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First-principles calculations of boron-related defects in SiO2
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Author keywords
[No Author keywords available]
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Indexed keywords
BORON;
SILICON DIOXIDE;
ARTICLE;
ATOM;
CALCULATION;
CHEMICAL BINDING;
COMPLEX FORMATION;
DIFFUSION;
ENERGY;
GEOMETRY;
SURFACE CHARGE;
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EID: 84870471359
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.68.184112 Document Type: Article |
Times cited : (28)
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References (44)
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