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Volumn 551, Issue , 2013, Pages 243-248

Effect of Cu on the microstructure and electrical properties of Cu/ZnO thin films

Author keywords

Cu ZnO thin films; Electric properties; Magnetron sputtering; Microstructure

Indexed keywords

COPPER LAYER; COPPER THICKNESS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FOUR-POINT PROBE ANALYSIS; GLASS SUBSTRATES; HEXAGONAL WURTZITE STRUCTURE; HIGH CRYSTALLINITY; MICRO-STRUCTURAL; RADIO FREQUENCY MAGNETRON SPUTTERING; REFLECTION PLANE; THIN-FILM STRUCTURE; XRD PEAKS; ZNO;

EID: 84869883808     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2012.10.032     Document Type: Article
Times cited : (22)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.