Effects of Ag layer and ZnO top layer thicknesses on the physical properties of ZnO/Ag/Zno multilayer system

Journal of Physics and Chemistry of Solids

Volumn 69, Issue 10, 2008, Pages 2378-2384

  Mohamed, S H ^a,b  

^a Sohag University   (Egypt)

^b QASSIM UNIVERSITY   (Saudi Arabia)

Author keywords

A. Multilayers; A. Oxides; D. Optical properties

Indexed keywords

COMPUTER NETWORKS; CONDUCTIVE FILMS; ELECTRIC RESISTANCE; ELECTROMAGNETIC WAVES; MAGNETRON SPUTTERING; MULTILAYERS; OPTICAL CONSTANTS; OPTICAL PROPERTIES; REFLECTION; REFLECTOMETERS; SEMICONDUCTING ZINC COMPOUNDS; SHEET RESISTANCE; ZINC; ZINC ALLOYS; ZINC OXIDE;

A. MULTILAYERS; A. OXIDES; D. OPTICAL PROPERTIES; LAYER THICKNESSES;

OPTICAL MULTILAYERS;

EID: 51049101239     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2008.03.019     Document Type: Article

References (29)

1. Park Y.R., Jung D., and Kim Y.S. Jpn. J. Appl. Phys. 47 (2008) 516
2. Yamada H., Ushimi Y., Kawamura H., Takeuchi M., Yoshino Y., and Makino T. Vacuum 80 (2006) 814
3. Yoshino Y., Makino T., Katayama Y., and Hata T. Vacuum 59 (2000) 538
4. Zhang C.Q., Tu J.P., Yuan Y.F., Huang X.H., Chen X.T., and Mao F. J. Electrochem. Soc. 154 (2007) A65
5. Zhang Q., Zhang S., Xie C., Fan C., and Bai Z. Sens. Actuators B: Chem. 128 (2008) 586
6. Chopra K.L., Major S., and Pandya D.K. Thin Solid Films 102 (1983) 1
7. Lin S.S., Huang J.L., and Lii D.F. Mater. Chem. Phys. 90 (2005) 22
8. Song D., Aberle A.G., and Xia J. Appl. Surf. Sci. 195 (2002) 291
9. Hu J., and Gordon R.G. J. Appl. Phys. 71 (1991) 880
10. Lampert C.M. Sol. Energy Mater. 6 (1981) 1
11. Fahland M., Karlsson P., and Charton C. Thin Solid Films 392 (2001) 334
12. Mohamed S.H., Kappertz O., Ngaruiya J.M., Leervad Pedersen T.P., Drese R., and Wuttig M. Thin Solid Films 429 (2003) 135
13. D. Severin, Structure formation and stabilization processes at reactive sputtering, Ph.D. Thesis, I. Physikalisches Institut IA, RWTH-Aachen, Germany, 2006, p. 101 (Chapter 6).
14. Lengeler B., and Hüppauff M.H. J. Anal. Chem. USSR 346 (1993) 155
15. Chason E., and Mayer T.M. Crit. Rev. Solid State Mater. Sci. 22 (1997) 1
16. van der Pauw L.J. Philips Res. Rep. 13 (1958) 1
17. Sahu D.R., Lin S.-Y., and Huang J.-L. Appl. Surf. Sci. 252 (2006) 7509
18. Powder Diffraction Files, Joint Committee on Powder Diffraction Standards, JCPDS, Card 21-1486, 1999.
19. Powder Diffraction Files, Joint Committee on Powder Diffraction Standards, JCPDS, Card 04-0783, 1999.
20. Powder Diffraction Files, Joint Committee on Powder Diffraction Standards, JCPDS, Card 35-0762, 1999.
21. Yoshino Y., Inoue K., Takeuchi M., Makino T., Katayama Y., and Hata T. Vacuum 59 (2000) 403
22. Sahu D.R., and Huang J.-L. Thin Solid Films 515 (2006) 876
23. Haacke G. J. Appl. Phys. 47 (1976) 4086
24. Alizadeh A., Sharma P., Ganti S., LeBoeuf S.F., and Tsakalakos L. J. Appl. Phys. 95 (2004) 8199
25. Yang Z.Q., and Xu Z.Z. Phys. Rev. B 54 (1996) 17577
26. Gai Y.Q., Yao B., Lu Y.M., Shen D.Z., Zhang J.Y., Zhao D.X., and Fan X.W. Phys. Lett. A 372 (2007) 72
27. Fox M. Optical Properties of Solids (2001), Oxford University Press, Oxford p. 5
28. Mohamed S.H., Ali H.M., Mohamed H.A., and Salem A.M. Eur. Phys. J. Appl. Phys. 31 (2005) 95
29. Pikhtin A.N., and Yas'Kov A.D. Sov. Phys. Semicond. 15 (1981) 81