Dependence of film thickness on the electrical and optical properties of ZnO-Cu-ZnO multilayers

Applied Surface Science

Volumn 253, Issue 2, 2006, Pages 915-918

  Sahu, D R ^a   Huang, Jow Lay ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Multilayers; Optical properties and Electrical properties; ZnO

Indexed keywords

ELECTRIC PROPERTIES; MAGNETRON SPUTTERING; MULTILAYERS; OPTICAL PROPERTIES; SPECTROPHOTOMETERS; THICK FILMS;

FILM THICKNESS; INTERMEDIATE METAL LAYERS; LOW RESISTIVITY; SHEET RESISTANCE;

ZINC OXIDE;

EID: 33845412282     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.01.035     Document Type: Article

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