Influence of oxygen on the electrical properties of aluminum-doped zinc-oxide thin films

Journal of the Korean Physical Society

Volumn 49, Issue 3, 2006, Pages 1256-1259

  Kim, Se Hyun ^a   Moon, Yeon Keon ^a   Moon, Dae Yong ^a   Hong, Min Soo ^a   Jeon, You Jin ^a   Park, Jong Wan ^a   Jeong, Chang Ho ^b  

^a Hanyang University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

AZO; Resistivity; TCOs

Indexed keywords

EID: 33749828065     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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