A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics

Review of Scientific Instruments

Volumn 83, Issue 8, 2012, Pages

  Weber, J C ^a,b   Schlager, J B ^a   Sanford, N A ^a   Imtiaz, A ^a   Wallis, T M ^a   Mansfield, L M ^c   Coakley, K J ^a   Bertness, K A ^a   Kabos, P ^a   Bright, V M ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF COLORADO   (United States)

^c NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COUPLED RESONATOR; CU(IN , GA)SE; DC CURRENT; FEEDBACK SYSTEMS; FREQUENCY RANGES; MICROWAVE REFLECTION; NANO SCALE; NEAR-FIELD SCANNING MICROWAVE MICROSCOPE; NONCONTACT MEASUREMENTS; PHOTOVOLTAIC; PHOTOVOLTAIC MATERIALS; PHOTOVOLTAICS; THIRD GENERATION; TOPOGRAPHIC DATA; TUNING FORKS;

GRAIN BOUNDARIES; IRIDIUM; PLATINUM;

TUNING;

EID: 84865737019     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4740513     Document Type: Review

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