Calibration protocol for broadband near-field microwave microscopy

IEEE Transactions on Microwave Theory and Techniques

Volumn 59, Issue 10 PART 2, 2011, Pages 2769-2776

  Farina, M ^a   Mencarelli, D ^a   Di Donato, A ^a   Venanzoni, G ^a   Morini, A ^a  

^a UNIVERSITÀ POLITECNICA DELLE MARCHE   (Italy)

Author keywords

Calibration; Microwave microscopy; Nanotechnology; Near field imaging

Indexed keywords

CALIBRATION PROTOCOLS; MICROSCOPY SYSTEMS; MICROWAVE MICROSCOPY; NEAR FIELD IMAGING; NEAR-FIELD MICROWAVE MICROSCOPY; QUANTITATIVE MEASUREMENT; SCANNING TUNNELING MICROSCOPES; VECTOR NETWORK ANALYZERS;

CALIBRATION; NANOTECHNOLOGY;

MICROWAVES;

EID: 84878019721     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2011.2161328     Document Type: Article

References (17)

1. E. A. Ash and G. Nicholls, "Super-resolution aperture scanning microscope," Nature, vol. 237, pp. 510-512, Jun. 1972.
2. C. P. Vlahacos, R. C. Black, S. M. Anlage, A. Amar, and F. C. Wellstood, "Near-field scanning microwave microscope with 100 m resolution," Appl. Phys. Lett., vol. 69, no. 21, pp. 3272-3274, 1996.
3. A. Imtiaz and S. M. Anlage, "A novel STM-assisted microwave microscope with capacitance and loss imaging capability," Ultramicroscopy, vol. 94, no. 3-4, pp. 209-216, 2003.
4. S. Kalinin and A. Gruverman, Scanning Probe Microscopy. New York: Springer, 2007.
5. J. R. Dizon, X. Wang, R. S. Aga, and J. Z. Wu, "Combining nearfield scanning microwave microscopy with transport measurement for imaging current-obstructing defects in HTS films," IEEE Trans. Appl. Superconduct., vol. 17, no. 2, pp. 3219-3222, Jun. 2007.
6. S. L. Stranick and P. S.Weiss, "Alternating current scanning tunnelling microscopy and nonlinear spectroscopy," J. Phys. Chem., vol. 98, pp. 1762-1764, 1994.
7. A. Tselev, S. M. Anlage, Z. Ma, and J. Melngailis, "Broadband dielectric microwave microscopy on mlength scales," Cornell Univ., Ithaca, NY, Jan. 2010. Online.. Available: arxiv.org
8. F. M. Serry, "Scanning microwave microscope," Agilent Technol., Santa Clara, CA, Agilent Appl. Note 5989-8818EN, 2008.
9. W. Han, "Introduction to scanning microwave microscopy," Agilent Technol., Santa Clara, CA, Agilent App. Note 5989-8881EN, 2008.
10. C. Gao, T. Wei, F. Duewer, Y. Lu, and X. D. Xiang, "High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope," Appl. Phys. Lett., vol. 71, no. 13, pp. 1872-1874, 1997.
11. C. Gao and X.-D. Xiang, "Quantitative microwave near-field microscopy of dielectric properties," Rev. Sci. Instrum., vol. 69, 1998, Art. ID 3846.
12. C. Gao, B. Hu, I. Takeuchi, K. S. Chang, X. D. Xiang, and G. Wang, "Quantitative scanning evanescent microwave microscopy and its applications in characterization of functional materials libraries," Meas. Sci. Technol., vol. 16, pp. 248-260, 2005.
13. A. Karbassi, D. Ruf, A. D. Bettermann, C. A. Paulson, D. W. van der Weide, H. Tanbakuchi, and R. Stancliff, "Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement," Rev. Sci. Instrum., vol. 79, 2008, Art. ID 094706.
14. S. Wua and J. Yu, "Attofarad capacitance measurement corresponding to single-molecular level structural variations of self-assembled monolayers using scanning microwave microscopy," Appl. Phys. Lett., vol. 97, Nov. 2010, Art. ID 202902.
15. M. Farina, A. Lucesoli, A. di Donato, D. Mencarelli, L. Maccari, G.Venanzoni, A. Morini, and T. Rozzi, Algorithm for reduction of noise in ultramicroscopy and application to near-field microwave microscopy, Electronics Letters(2010), vol.46, no.1, pp. 50-52, DOI:10.1049/el.2010.2859.
16. S. Kurokawa and A. Sakai, "Tip-sample capacitance in STM," Faculty Eng., Mesoscopi Mater. Res. Center, Kyoto Univ., Sakyo-ku, Kyoto, Japan, Sci. Rep. RITU A44-2, 1997, pp. 173-179.
17. M. Farina and T. Rozzi, "A short-open de-embedding technique for method of moments-based electromagnetic analyses," IEEE Trans. Microw. Theory Tech., vol. 49, no. 4, pp. 624-628, Apr. 2001.