Glue-free tuning fork shear-force microscope

Review of Scientific Instruments

Volumn 77, Issue 1, 2006, Pages 1-3

  Muhlschlegel P ^a   Toquant, J ^a   Pohl, D W ^a   Hecht, B ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; IMAGE PROCESSING; OPTICAL FIBERS; PRESSURE EFFECTS; SCANNING;

ELASTIC DEFORMATION; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SHEAR-FORCE SENSOR;

OPTICAL MICROSCOPY;

EID: 31544475955     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2165548     Document Type: Article

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