메뉴 건너뛰기




Volumn 72, Issue 1-4, 2002, Pages 389-401

Defect and impurity diagnostics and process monitoring

Author keywords

Carrier lifetime; Defects; Impurities; Process monitoring; Silicon solar cells

Indexed keywords

CONDITION MONITORING; DEFECTS; IMPURITIES; INDUCED CURRENTS; LIGHT; QUANTUM EFFICIENCY; SPECTROSCOPIC ANALYSIS; STABILITY;

EID: 0036533225     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(01)00187-8     Document Type: Conference Paper
Times cited : (40)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.