Distance control for a near-field scanning microwave microscope in liquid using a quartz tuning fork

Applied Physics Letters

Volumn 86, Issue 15, 2005, Pages 1-3

  Kim, Songhui ^a   Yoo, Hyunjun ^a   Lee, Kiejin ^a   Friedman, Barry ^b   Gaspar, Mariafrancis A ^c   Levicky, Rastislav ^c  

^a Sogang University   (South Korea)

^b SAM HOUSTON STATE UNIVERSITY   (United States)

^c Columbia University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER FILM; DISTANCE CONTROL METHOD; DISTANCE CONTROL PARAMETER; NEAR-FIELD MICROWAVE MICROSCOPE (NSMM);

AIR; COPPER; DIELECTRIC DEVICES; DNA; METALLIC FILMS; NATURAL FREQUENCIES; QUARTZ; RESONATORS; WATER;

MICROSCOPES;

EID: 20844436877     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1904713     Document Type: Article

References (21)

1. M. Tabib-Azar, P. S. Pathak, and G. Ponchak, Rev. Sci. Instrum. 70, 2783 (1999).
2. J. Bae, T. Okamoto, T. Fujii, K. Mizuno, and T. Nozokido, Appl. Phys. Lett. 71, 3581 (1997).
3. Y. Cho, S. Kazuta, and K. Matsuura, Appl. Phys. Lett. 75, 2833 (1999).
4. C. P. Vlahacos, D. E. Steinhauer, S. K. Dutta, B. J. Feenstra, S. M. Anlage, and F. C. Wellstood, Appl. Phys. Lett. 72, 1778 (1998).
5. S. K. Dutta, C. P. Vlahacos, D. E. Steinhauer, A. S. Thanawalla, B. J. Feenstra, F. C. Wellstood, S. M. Anlage, and H. S. Newman, Appl. Phys. Lett. 74, 156 (1999).
6. C. Gao, T. Wei, F. Duewer, Y. Lu, and X.-D. Xiang, Appl. Phys. Lett. 71, 1872 (1997).
7. M. Golosovsky and D. Davidov, Appl. Phys. Lett. 68, 1579 (1996).
8. M. Abu-Teir, M. Golosovsky, D. Davidov, A. Frenkel, and H. Goldberger, Rev. Sci. Instrum. 72, 2073 (2001).
9. T. Kaiser, M. A. Hein, G. Muller, and M. Perpeet, Appl. Phys. Lett. 73, 3447 (1998).
10. A. F. Lann, M. Golosovsky, D. Davidov, and A. Frenkel, Appl. Phys. Lett. 73, 2823 (1998).
11. B. Knoll, F. Keilmann, A. Kramer, and R. Guckenberger, Appl. Phys. Lett. 70, 2667 (1997).
12. M. S. Kim, S. Kim, J. Kim, K. Lee, B. Friedman, J. Kim, and J. Lee, Rev. Sci. Instrum. 74, 3675 (2003).
13. S. Hong, J. Kim, and K. Lee, Appl. Phys. Lett. 80, 524 (2002).
14. J. Kim, M. S. Kim, K. Lee, J. Lee, D. Cha, and B. Friedman, Meas. Sci. Technol. 14, 7 (2003).
15. K. Karrai and R. D. Grober, Appl. Phys. Lett. 66, 1842 (1995).
16. E. Betzig, P. L. Finn, and J. S. Weiner, Appl. Phys. Lett. 60, 2484 (1992).
17. R. D. Grober, T. D. Harris, J. K. Trautman, and E. Betzig, Rev. Sci. Instrum. 65, 626 (1994).
18. W. H. J. Rensen, N. F. van Hulst, and S. B. Kammer, Appl. Phys. Lett. 77, 1557 (2000).
19. L. F. Lee, R. D. Schaller, L. H. Haber, and R. J. Saykally, Anal. Chem. 73, 5015 (2001).
20. M. Koopman, B. I. De Bakker, M. F. Garcia-Pparajo, and N. F. van Hulst, Appl. Phys. Lett. 83, 5083 (2003).
21. J. Kim, M. Kim, H. Kim, D. Song, K. Lee, and B. Friedman, Appl. Phys. Lett. 83, 1026 (2003).