Effect of tip polarity on Kelvin probe force microscopy images of thin insulator CaF 2 films on Si(111)

Applied Physics Letters

Volumn 101, Issue 8, 2012, Pages

  Yurtsever, Ayhan ^a   Sugimoto, Yoshiaki ^a   Fukumoto, Masaki ^a   Abe, Masayuki ^a,b   Morita, Seizo ^a  

^a OSAKA UNIVERSITY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; CONTACT POTENTIAL DIFFERENCE; IMAGE CONTRASTS; IMAGING MODES; KELVIN PROBE FORCE MICROSCOPY; NONCONTACT ATOMIC FORCE MICROSCOPY; SI (1 1 1); TIP APEX;

PROBES; SILICON;

ATOMIC FORCE MICROSCOPY;

EID: 84865450014     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4748291     Document Type: Article

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