Atomically resolved imaging of a CaF bilayer on Si(111): Subsurface atoms and the image contrast in scanning force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 3, 2004, Pages

  Klust, Andreas ^a,c   Ohta, Taisuke ^b   Bostwick, Aaron A ^a   Yu, Qiuming ^a   Ohuchi, Fumio S ^b   Olmstead, Marjorie A ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

^b University of Washington   (United States)

^c Tulane University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM FLUORIDE; SILICON;

ARTICLE; ATOM; ELECTRICITY; ENERGY; FORCE; GEOMETRY; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGE RECONSTRUCTION; MODEL; PREDICTION; SCANNING FORCE MICROSCOPY;

EID: 1442263693     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.035405     Document Type: Article

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