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Volumn 22, Issue 34, 2012, Pages 17568-17572

Low-voltage driving solution-processed nickel oxide based unipolar resistive switching memory with Ni nanoparticles

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANDOM ACCESS MEMORY; EMBEDDED DEVICE; INSULATOR THICKNESS; LOW-VOLTAGE DRIVING; NI NANOPARTICLES; NIO THIN FILM; NONVOLATILE FLASH MEMORIES; OXYGEN MOBILITY; RESISTIVE RANDOM ACCESS MEMORY; RESISTIVE SWITCHING; RESISTIVE SWITCHING MEMORIES; SOLUTION-PROCESSED;

EID: 84865011455     PISSN: 09599428     EISSN: 13645501     Source Type: Journal    
DOI: 10.1039/c2jm33032f     Document Type: Article
Times cited : (29)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.