Nanostructured mesoporous nickel oxide thin films

Nanotechnology

Volumn 18, Issue 11, 2007, Pages

  Sasi, B ^a   Gopchandran, K G ^a  

^a UNIVERSITY OF KERALA   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MESOPOROUS MATERIALS; NANOSTRUCTURED MATERIALS; NICKEL OXIDE; SELF ASSEMBLY; X RAY PHOTOELECTRON SPECTROSCOPY;

ANNEALING TEMPERATURE; SURFACE CONTAMINANTS;

THIN FILMS;

NANOCRYSTAL; NANOMATERIAL; NANOPARTICLE; NICKEL; OXYGEN;

ARTICLE; ATOMIC FORCE MICROSCOPY; PARTICLE SIZE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TEMPERATURE; THIN FILAMENT; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33947545395     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/11/115613     Document Type: Article

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