Surface electrical conductivity measurement system with micro-four-point probes at sub-Kelvin temperature under high magnetic field in ultrahigh vacuum

e-Journal of Surface Science and Nanotechnology

Volumn 10, Issue , 2012, Pages 400-405

  Yamada, Manabu ^a   Hirahara, Toru ^a   Hobara, Rei ^a   Hasegawa, Shuji ^a   Mizuno, Hiroyuki ^b   Miyatake, Yutaka ^b   Nagamura, Toshihiko ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b Japan Science and Technology Agency   (Japan)

Author keywords

Dual con guration method; In; Micro four point probe; Si(111); Surface electrical transport; Surface state superconductivity

Indexed keywords

INDIUM; MAGNETIC FIELDS; SURFACE STATES; ULTRAHIGH VACUUM;

CRITICAL MAGNETIC FIELD; DUAL CON-GURATION METHOD; MICRO-FOUR-POINT PROBES; SI (1 1 1); SURFACE ELECTRICAL CONDUCTIVITY; SURFACE ELECTRICAL TRANSPORT; SURFACE NORMAL DIRECTIONS; ULTRA-HIGH-VACUUM SYSTEMS;

PROBES;

EID: 84864755186     PISSN: None     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2012.400     Document Type: Article

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