Microfour-point probe for studying electronic transport through surface states

Applied Physics Letters

Volumn 77, Issue 23, 2000, Pages 3782-3784

  Petersen, C L ^a   Grey, F ^a   Shiraki, I ^b   Hasegawa, S ^b  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038488842     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1329871     Document Type: Article

References (17)

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