Structures and electronic transport on silicon surfaces

Progress in Surface Science

Volumn 60, Issue 5, 1999, Pages 89-257

  Hasegawa, Shuji ^a,b   Tong, Xiao ^a   Takeda, Sakura ^a   Sato, Norio ^a   Nagao, Tadaaki ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CARRIER MOBILITY; CORRELATION METHODS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRON TRANSPORT PROPERTIES; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH; SUBSTRATES; SURFACE PHENOMENA;

ATOMIC-SCALE STRUCTURES; SURFACE SUPERSTRUCTURES;

SURFACE STRUCTURE;

EID: 0032688708     PISSN: 00796816     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0079-6816(99)00008-8     Document Type: Review

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