Quantitative statistical analysis of dielectric breakdown in zirconia-based self-assembled nanodielectrics

ACS Nano

Volumn 6, Issue 5, 2012, Pages 4452-4460

  Schlitz, Ruth A ^a,c   Ha, Young Geun ^b,d   Marks, Tobin J ^a,b   Lauhon, Lincoln J ^a  

^a Northwestern University   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d Korea Atomic Energy Research Institute   (South Korea)

Author keywords

Dielectric breakdown; Reliability; SAND; Self assembly; Weibull analysis

Indexed keywords

BREAKDOWN BEHAVIOR; DEVICE APPLICATION; MULTIPLE CHARACTERISTICS; NANODIELECTRICS; SELF ASSEMBLED MULTILAYERS; SELF-ASSEMBLED; TWO-REGIME; WEIBULL ANALYSIS; WEIBULL PLOTS;

MULTILAYERS; RELIABILITY; RELIABILITY ANALYSIS; SAND; SELF ASSEMBLY; WEIBULL DISTRIBUTION; ZIRCONIA; ZIRCONIUM;

ELECTRIC BREAKDOWN;

EID: 84864715461     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn3011834     Document Type: Article

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