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Volumn 520, Issue 20, 2012, Pages 6386-6392

Plasma diagnostics of an Ar/NH 3 direct-current reactive magnetron sputtering discharge for SiN x deposition

Author keywords

Optical emission spectroscopy; Plasma magnetron; Silicon nitride; X ray photoelectron spectroscopy

Indexed keywords

CHEMICAL STATE; CONTINUOUS TRANSITIONS; DC REACTIVE MAGNETRON SPUTTERING; DIRECT-CURRENT; GASPHASE; MOLAR FRACTIONS; REACTIVE MAGNETRON SPUTTERING; SILICON NITRIDE THIN FILMS; SILICON TARGETS; SPUTTERING PROCESS; TARGET SURFACE; XPS MEASUREMENTS;

EID: 84863982316     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.06.048     Document Type: Article
Times cited : (22)

References (33)
  • 17
    • 45549087656 scopus 로고    scopus 로고
    • NIST ASD Team [Online]. National Institute of Standards and Technology, Gaithersburg, MD
    • Yu Ralchenko, A. Kramida, J. Reader NIST ASD Team NIST Atomic Spectra Database (version 4.1) 2011 [Online]. Available: http://physics.nist.gov/asd National Institute of Standards and Technology, Gaithersburg, MD.
    • (2011) NIST Atomic Spectra Database (Version 4.1)
    • Ralchenko, Y.1    Kramida, A.2    Reader, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.