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Volumn 520, Issue 20, 2012, Pages 6386-6392
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Plasma diagnostics of an Ar/NH 3 direct-current reactive magnetron sputtering discharge for SiN x deposition
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Author keywords
Optical emission spectroscopy; Plasma magnetron; Silicon nitride; X ray photoelectron spectroscopy
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Indexed keywords
CHEMICAL STATE;
CONTINUOUS TRANSITIONS;
DC REACTIVE MAGNETRON SPUTTERING;
DIRECT-CURRENT;
GASPHASE;
MOLAR FRACTIONS;
REACTIVE MAGNETRON SPUTTERING;
SILICON NITRIDE THIN FILMS;
SILICON TARGETS;
SPUTTERING PROCESS;
TARGET SURFACE;
XPS MEASUREMENTS;
DEPOSITION;
EMISSION SPECTROSCOPY;
LIGHT EMISSION;
MAGNETRON SPUTTERING;
OPTICAL EMISSION SPECTROSCOPY;
PHOTOELECTRONS;
PLASMA DIAGNOSTICS;
X RAY PHOTOELECTRON SPECTROSCOPY;
SILICON NITRIDE;
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EID: 84863982316
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2012.06.048 Document Type: Article |
Times cited : (22)
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References (33)
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