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Volumn 116-119, Issue , 1999, Pages 622-628

Plasma enhanced chemical vapor deposition of SiN-films for passivation of three-dimensional substrates

Author keywords

Coating; Passivation; PECVD; Silicon nitride; Three dimensional substrates

Indexed keywords

AMMONIA; ARGON; ELECTRON CYCLOTRON RESONANCE; ETCHING; NITROGEN; PASSIVATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; PROTECTIVE COATINGS; REFRACTIVE INDEX; SILANES; SILICON NITRIDE; THERMAL EFFECTS;

EID: 0033387841     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(99)00135-8     Document Type: Conference Paper
Times cited : (33)

References (10)
  • 5
    • 0003666038 scopus 로고
    • G. Lucovsky, D.V. Tsu, R.J. Markunas, S.M. Rossnagel, J.J. Cuomo, & W.D. Westwood. New Jersey: Noyes Publications
    • Lucovsky G., Tsu D.V., Markunas R.J., Rossnagel S.M., Cuomo J.J., Westwood W.D. Handbook of Plasma Processing Technology. 1990;387 Noyes Publications, New Jersey.
    • (1990) Handbook of Plasma Processing Technology , pp. 387


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.