Nanomanipulation and nanofabrication with multi-probe scanning tunneling microscope: From individual atoms to nanowires

Review of Scientific Instruments

Volumn 83, Issue 6, 2012, Pages

  Qin, Shengyong ^a   Kim, Tae Hwan ^a   Wang, Zhouhang ^b   Li, An Ping ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b RHK Technology Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC POSITIONS; ELECTRICAL CHARACTERIZATION; FUNCTIONAL DEVICES; FUNDAMENTAL BUILDING BLOCKS; IN-SITU CHARACTERIZATION; MANIPULATION TOOLS; MULTIPLE SCANNING; NANO-DEVICES; NANOMANIPULATIONS; NANOSCALE STRUCTURE; NANOSCIENCE AND NANOTECHNOLOGIES; POSITIONING PRECISION; SCANNING TUNNELING MICROSCOPES; WIDE FIELD OF VIEW;

LATTICE CONSTANTS; MICROSCOPES; NANOSCIENCE; NANOTUBES; NANOWIRES; RAPID PROTOTYPING; SCANNING ELECTRON MICROSCOPY;

MICROMANIPULATORS;

EID: 84863513463     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4727878     Document Type: Review

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