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Volumn 127, Issue 23, 2005, Pages 8268-8269

Nano-welding by scanning probe microscope

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE; FERRIC OXIDE; SILICON;

EID: 20444454024     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja051280r     Document Type: Article
Times cited : (46)

References (19)
  • 14
    • 20444452194 scopus 로고    scopus 로고
    • note
    • (b) Data not shown that fracture has happened under this annealing condition, where there was no welding, and it may come from the defect formed in the growth process.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.